The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Nov. 27, 2018
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Arnold Mueller-Rentz, Brechen, DE;
Christian Schulz, Solms-Albshausen, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope system includes a detection unit having a color beam splitter arrangement with three beam splitter prisms, each having first, second and third prism surfaces. The first prism surfaces face in the same direction and are oriented parallel to one another at a right angle to an optical axis. The first and second prism surfaces are oriented in each case at acute angles to one another. The second and third prism surfaces are oriented in each case at right or obtuse angles to one another. The third and first prism surfaces are oriented in each case at acute angles to one another. A prismatic compensation element having first and second prism surfaces is assigned to each prism. The second prism surface of each of the compensation elements is arranged in a common plane with or parallel to the second prism surface of the respectively assigned prism.