The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Sep. 27, 2019
Applicant:

The Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventors:

Curtis L. Johnson, Wilmington, DE (US);

Bradley P. Sutton, Savoy, IL (US);

Joseph L. Holtrop, Memphis, TN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/567 (2006.01); G01R 33/563 (2006.01); G01R 33/48 (2006.01); G01R 33/561 (2006.01); G01R 33/483 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5673 (2013.01); G01R 33/56358 (2013.01); G01R 33/4826 (2013.01); G01R 33/4835 (2013.01); G01R 33/5611 (2013.01); G01R 33/5676 (2013.01);
Abstract

A method and system provides an acquisition scheme for generating magnetic resonance elastography displacement data with whole-sample coverage, high spatial resolution, and adequate SNR in a short scan time. The method and system can acquire in-plane and through-plane k-space shots over a volume of a sample divided into a plurality of slabs that each include a plurality of non-adjacent slices to obtain three dimensional multiband, multishot data, can apply multiband radio frequency refocusing pulses to the sample, can acquire navigators before readout, and can correct for non-linear motion errors.


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