The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Mar. 27, 2019
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventor:

Sylvain Leirens, Grenoble, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01); G06F 3/041 (2006.01); G01R 33/038 (2006.01); G06F 3/046 (2006.01); G01D 3/02 (2006.01);
U.S. Cl.
CPC ...
G01R 33/1215 (2013.01); G01D 3/022 (2013.01); G01R 33/038 (2013.01); G06F 3/046 (2013.01); G06F 3/0414 (2013.01); G06F 3/0418 (2013.01);
Abstract

A method for initializing a sensor array comprises executing a statistical test on a set consisting of first measurements measured by the sensors of the array, the statistical test being able to detect in the first measurements at least one aberrant measurement caused by a presence of an object, called a disruptor, this disruptor modifying the measured physical quantity nonuniformly, wherein if the execution of the statistical test detects at least one aberrant measurement, then the method comprises signaling the presence of the disruptor, and if the execution of the statistical test does not detect at least one aberrant measurement, then the method comprises acquiring second measurements of the physical quantity, the second measurements being measured by the sensors.


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