The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Dec. 08, 2015
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventor:
Keith A. Jenkins, Sleepy Hollow, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 30/3312 (2020.01); G01R 31/3193 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G01R 31/30 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2882 (2013.01); G01R 31/3177 (2013.01); G01R 31/31725 (2013.01); G01R 31/31937 (2013.01); G06F 30/3312 (2020.01); G01R 31/30 (2013.01);
Abstract
A computer system may determine a first set of output values for a set of test paths at a first time. Each output value may correspond to a test path in the set of test paths. The computer system may then determine a second set of output values at a second time. Each output value in the second set of output values may have an associated output value in the first set of output values. The computer system may then determine whether degradation of the semiconductor chip has occurred by comparing the first set of output values to the second set of output values.