The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Mar. 26, 2019
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Sven Barthel, Chemnitz, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.