The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Mar. 08, 2019
Applicant:
Quidel Corporation, San Diego, CA (US);
Inventors:
Richard L. Egan, Oceanside, CA (US);
Michael Jon Hale, San Diego, CA (US);
Jhobe Steadman, San Diego, CA (US);
Assignee:
Quidel Corporation, San Diego, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 33/53 (2006.01); G01N 33/569 (2006.01); G01N 21/64 (2006.01); G01N 33/558 (2006.01); G01N 21/84 (2006.01); B01L 9/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54366 (2013.01); B01L 9/52 (2013.01); G01N 21/6428 (2013.01); G01N 21/6486 (2013.01); G01N 21/8483 (2013.01); G01N 33/53 (2013.01); G01N 33/558 (2013.01); G01N 33/56944 (2013.01); G01N 33/56983 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0825 (2013.01); G01N 2021/6439 (2013.01); G01N 2201/12707 (2013.01); G01N 2201/12792 (2013.01); G01N 2333/11 (2013.01); G01N 2469/10 (2013.01);
Abstract
A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device.