The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Dec. 28, 2018
University of Notre Dame Du Lac, Notre Dame, IN (US);
Scott S. Howard, Notre Dame, IN (US);
Yide Zhang, Notre Dame, IN (US);
Cody J. Smith, Notre Dame, IN (US);
UNIVERSITY OF NOTRE DAME DU LAC, Notre Dame, IN (US);
Abstract
A microscopy method and system includes obtaining a plurality of raw fluorescence images, respective ones of the plurality of raw fluorescence images obtained by exciting a sample using a light source at a respective irradiance value in a weak saturation region of the sample, and capturing the respective raw fluorescence image; applying a plurality of weights to the plurality of raw fluorescence images in a one-to-one correspondence so as to generate a plurality of weighted fluorescence images, wherein a respective weight is based on the respective irradiance value at which the corresponding raw fluorescence image was obtained; and linearly combining the plurality of weighted fluorescence images, thereby generating the output image having a resolution greater than a diffraction limit. Respective raw fluorescence images correspond to irradiance values different from one another.