The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

May. 16, 2018
Applicant:

Washington University, St. Louis, MO (US);

Inventors:

Sahin Kaya Ozdemir, St. Louis, MO (US);

Lan Yang, St. Louis, MO (US);

Bo Peng, St. Louis, MO (US);

Assignee:

Washington University, St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 21/77 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 21/7746 (2013.01); G01N 2021/655 (2013.01); Y10S 977/88 (2013.01);
Abstract

A system and method for engineering loss in a physical system by steering parameters of the physical system to the vicinity of an exceptional point is disclosed. In the vicinity of an exceptional point, localization of the fields helps to enhance any linear or nonlinear processes. As examples loss-induced transparency in the intracavity field intensities of coupled resonators, loss-induced suppression and enhancement of thermal nonlinearity in coupled resonators and loss-induced suppression and revival of Raman lasing in whispering-gallery-microcavities are demonstrated.


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