The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Jan. 30, 2018
Siemens Aktiengesellschaft, Munich, DE;
Giuseppe Fabio Ceschini, Florence, IT;
Alexey Fishkin, Munich, DE;
Thomas Hubauer, Garching bei München, DE;
Alin Murarasu, Munich, DE;
Mikhail Roshchin, Munich, DE;
Nicoló Gatta, Porto Fuori, IT;
Mauro Venturini, Rovigo, IT;
Abstract
Provided is a method for providing measured values of a technical installation in which measured values in at least one measurement series are captured, wherein a respective measured value is provided by a measurement sensor for a respective physical measurement variable in the technical installation for a respective measurement time. The measured values are categorized as normal measured values or anomalous measured values with the aid of a threshold value comparison and at least one further method stage. The further method stage comprises calculating one or more statistical position parameters for selected measured values from the same measurement series and/or different measurement series. The method makes it possible to increase the reliability of the measured values provided. A technical system comprising the technical installation, at least one measurement sensor and a program-controlled device, and a method for operating the technical system are also proposed.