The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Mar. 08, 2018
Applicant:

The University of Chicago, Chicago, IL (US);

Inventors:

Chuan He, Chicago, IL (US);

Boxuan Simen Zhao, Chicago, IL (US);

Pradnya Narkhede, Chicago, IL (US);

Chang Liu, Chicago, IL (US);

Xiaolong Cui, Chicago, IL (US);

Assignee:

THE UNIVERSITY OF CHICAGO, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6844 (2018.01); C12Q 1/6806 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6844 (2013.01); C12Q 1/6806 (2013.01);
Abstract

Methods, compositions and kits are provided to amplify the amount of genomic methylated DNA can by subsequently analyzed and/or sequenced. It has particular use with small amounts of DNA, including, but not limited to cell free DNA samples. In some embodiments, the ratio of polymerase and methyltransferase is controlled in order to provide maximum yields. In some embodiments, a dual primase/polymerase is used.


Find Patent Forward Citations

He, Chuan. (2021). Method for highly sensitive dna methylation analysis (U.S. Patent No. 11130991). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11130991

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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