The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Mar. 29, 2018
Applicant:

Dai Nippon Printing Co., Ltd., Tokyo, JP;

Inventors:

Toshifumi Fujii, Tokyo, JP;

Yuri Kitahara, Tokyo, JP;

Nobuo Saito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 45/14 (2006.01); B32B 27/30 (2006.01); B32B 15/08 (2006.01); B32B 27/36 (2006.01); B32B 33/00 (2006.01);
U.S. Cl.
CPC ...
B29C 45/14 (2013.01); B32B 27/30 (2013.01); B29C 2791/006 (2013.01); B32B 15/08 (2013.01); B32B 27/36 (2013.01); B32B 33/00 (2013.01); B32B 2367/00 (2013.01);
Abstract

Provided is a decorative sheet having an excellent decorative appearance due to surface unevenness, as well as excellent abrasion resistance and moldability. This decorative sheet includes at least a substrate layer and a surface protective layer located on the surface of the substrate layer, wherein: the surface protective layer has a cross section in the direction of thickness; the cross section has an unevenness formed, on such surface side, by a repeating pattern including recesses and projections which are mutually adjacent; and the ratio of the measured average surface protective layer thickness (μm) at the recesses, T, and the measured average surface protective layer thickness (μm) at the projections, T, (average T/average T) satisfies the relationship of 0.10≤Taverage/Taverage≤0.35.


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