The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Aug. 23, 2017
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Hiromatsu Aoki, Suita, JP;

Masao Hiramoto, Katano, JP;

Tomoaki Kimura, Fujisawa, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/024 (2006.01); A61B 5/0245 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0245 (2013.01); A61B 5/726 (2013.01); A61B 5/0077 (2013.01); A61B 5/02416 (2013.01); A61B 5/6898 (2013.01); A61B 5/7257 (2013.01);
Abstract

A pulse measuring device includes: an image acquisition unit that acquires plural pieces of time-series photographed image data obtained by photographing a living body; an image processor that generates plural pieces of transformed image data corresponding to the plural pieces of photographed image data by performing a multiple resolution analysis on each of the plural pieces of photographed image data a plurality of times, each of the plural pieces of photographed image data being decomposed into a high-resolution component and a low-resolution component on the multiple resolution analysis; and a pulse measuring unit that calculates a feature quantity indicating luminance of a predetermined area in each of the plural pieces of transformed image data, calculates a variation period of the feature quantity by analyzing time-series data of the feature quantity, and calculates a pulse of the living body based on the variation period of the feature quantity.


Find Patent Forward Citations

Loading…