The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Jan. 06, 2020
Sap SE, Walldorf, DE;
Eugen Pritzkau, Wiesloch, DE;
Joscha Philipp Bohn, Heidelberg, DE;
Daniel Kartmann, Oftersheim, DE;
Wei-Guo Peng, Dallau, DE;
Hristina Dinkova, Nussloch, DE;
Lin Luo, Wiesloch, DE;
Thomas Kunz, Lobenfeld, DE;
Marco Rodeck, Maikammer, DE;
Hartwig Seifert, Elchesheim-Illingen, DE;
Harish Mehta, Wiesenbach, DE;
Nan Zhang, Schriesheim, DE;
Rita Merkel, Ilvesheim, DE;
Florian Chrosziel, St. Leon-Rot, DE;
SAP SE, Walldorf, DE;
Abstract
Search results are received from an initiated free text search of log data from one or more logs, where the free text is performed using search terms entered into a free text search graphical user interface. A set of at least one search result is selected from the search results containing an event desired to be identified in a completed enterprise threat detection (ETD) pattern. A forensic lab application is rendered to complete an ETD pattern. An event filter is added for an event type based on normalized log data to a path. A relative ETD pattern time range is set and an ETD pattern is completed based on the added event filter.