The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Jul. 15, 2020
Texas Instruments Incorporated, Dallas, TX (US);
Kiran Rajmohan, Ernakulam, IN;
Kalyan Chakravarthi Chekuri, Bangalore, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A test system and interface circuitry for antenna-free bit error rate testing of an electronic device under test, including a pulse shaping circuit with a pulse shaping filter circuit to pulse shape a modulating signal before amplitude modulation with a carrier signal, and the amplitude modulated signal is coupled directly or via a transformer and a socket to the device under test without antennas to facilitate automated device testing with simple reconfiguration of signal generators for different device type. A method includes filtering a square wave modulating signal to create a pulse shaped modulating signal, amplitude modulating a carrier signal with the pulse shaped modulating signal to create an amplitude modulated signal, providing the amplitude modulated signal to the socket, and evaluating a bit error rate of the DUT according to receive data from the DUT and according to the BER test transmit data.