The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Jul. 27, 2020
United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);
Michael J. Krasowski, Cleveland, OH (US);
Norman F. Prokop, Cleveland, OH (US);
Philip G. Neudeck, Cleveland, OH (US);
David J. Spry, Cleveland, OH (US);
Abstract
Methods and devices are disclosed for compensating for device property variations across a wafer. The method comprises determining an output of a first device based on an input and determining an output of a second device based on the input. The second device is located at a different position with respect to a center of the wafer than a position of the first device with respect to the center of the wafer. The method further comprises determining a difference between the output of the first device and the output of the second device, the difference arising at least in part from the difference in position of the first and second devices. The method further comprises altering the first device such that the output of the first device based on the input substantially matches the output of the second device based on the input.