The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Apr. 04, 2017
Applicant:

Shin-etsu Chemical Co., Ltd., Tokyo, JP;

Inventors:

Shoji Akiyama, Gunma, JP;

Masayuki Tanno, Gunma, JP;

Koji Kato, Gunma, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 3/08 (2006.01); H01L 21/02 (2006.01); H01L 21/762 (2006.01); H01L 21/20 (2006.01); H03H 9/02 (2006.01); B32B 38/00 (2006.01);
U.S. Cl.
CPC ...
H03H 3/08 (2013.01); H01L 21/02002 (2013.01); H01L 21/2007 (2013.01); H01L 21/76256 (2013.01); H03H 9/02559 (2013.01); H03H 9/02574 (2013.01); B32B 38/0008 (2013.01); B32B 2310/0875 (2013.01); Y10T 156/10 (2015.01);
Abstract

To provide a method for producing a composite wafer capable of reducing a spurious arising by reflection of an incident signal on a joint interface between a lithium tantalate film and a supporting substrate, in the composite wafer including a supporting substrate having a low coefficient of thermal expansion, and a lithium tantalate film having a high coefficient of thermal expansion stacked on the supporting substrate. The method for producing a composite wafer is a method for producing a composite wafer that produces a composite wafer by bonding a lithium tantalate wafer having a high coefficient of thermal expansion to a supporting wafer having a low coefficient of thermal expansion, wherein prior to bonding together, ions are implanted from a bonding surface of the lithium tantalate wafer and/or the supporting wafer, to disturb crystallinity near the respective bonding surfaces.


Find Patent Forward Citations

Loading…