The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Feb. 02, 2017
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Takahiro Ohori, Osaka, JP;

Hideki Tamura, Shiga, JP;

Yusuke Tanji, Osaka, JP;

Shingo Okaura, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60M 7/00 (2006.01); B60L 50/60 (2019.01); B60L 53/122 (2019.01); H02J 50/80 (2016.01); H02J 50/12 (2016.01); H02J 7/00 (2006.01);
U.S. Cl.
CPC ...
H02J 50/80 (2016.02); B60L 50/60 (2019.02); B60L 53/122 (2019.02); B60M 7/00 (2013.01); H02J 7/00032 (2020.01); H02J 50/12 (2016.02); H02J 2207/20 (2020.01);
Abstract

A contactless power feeding system includes: a primary circuit for supplying primary power to a power feeding coil; and a primary control circuit for controlling the primary circuit. The primary control circuit acquires, from a secondary control circuit, a secondary measured value and a secondary target value of secondary power received by a power receiving coil. The primary control circuit performs control processing and update processing alternately and repeatedly. The control processing is processing of controlling the primary circuit to bring the primary measured value into conformity with a primary target value. The update processing is processing of updating the primary target value. The update processing includes processing of calculating the primary target value based on transfer efficiency to be determined by the primary measured value and the secondary measured value and on the secondary target value.


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