The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Nov. 16, 2018
Applicant:

Christie Enke, Placitas, NM (US);

Inventor:

Christie Enke, Placitas, NM (US);

Assignee:

UNM Rainforest Innovations, Albuquerque, NM (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/02 (2006.01);
U.S. Cl.
CPC ...
H01J 49/403 (2013.01); H01J 49/022 (2013.01); H01J 49/025 (2013.01);
Abstract

A detector system for targeted analysis and/or sample collection by distance-of-flight mass spectrometry (tDOF-MS).


Find Patent Forward Citations

Enke, Christie. (2021). Detector system for targeted analysis by distance-of-flight mass spectrometry (U.S. Patent No. 11127580). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11127580

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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