The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Jun. 29, 2020
Applicant:

Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Zhuyin Chu, Beijing, CN;

Chaofeng Li, Beijing, CN;

Wengui Liu, Beijing, CN;

Wei Wang, Beijing, CN;

Jinghui Guo, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/28 (2006.01); H01J 49/00 (2006.01); G01N 30/72 (2006.01); H01J 49/16 (2006.01); G01N 30/88 (2006.01);
U.S. Cl.
CPC ...
H01J 49/28 (2013.01); G01N 30/72 (2013.01); H01J 49/0027 (2013.01); H01J 49/16 (2013.01); G01N 2030/8868 (2013.01); H01J 49/0036 (2013.01);
Abstract

A zircon ID-TIMDS Pb isotope determination method by multiple ion counters with a dynamic multi-collection protocol is provided. Compared with a commonly used multi-ion counter static determination method, the method provided by the present invention completely eliminates influences of gain differences of the different ion counters on determination results of Pb isotopes. Compared with a conventional single-ion counter determination method with five times of peak-jumps, the method provided by the present invention can obtain all of Pb isotope ratios with two times of peak-jumps, which increases the collection efficiency of Pb isotope ion beams and decreases influences of ion beam stability on Pb isotope analysis results. Consequently, compared with a multi-ion counter static method and a single-ion counter peak-jumping method, the method provided by the present invention improves the Pb isotope analysis precision for the single-grain zircon ID-TIMS U—Pb dating method (with aPb tracer), having application potentials.


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