The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Dec. 19, 2019
Applicant:

X Development Llc, Mountain View, CA (US);

Inventors:

Sylvia J. Smullin, Menlo Park, CA (US);

Albin Lee Jones, Half Moon Bay, CA (US);

Joseph Sargent, San Francisco, CA (US);

Marina Dolivo, San Jose, CA (US);

Assignee:

X Development LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/08 (2011.01); G06T 17/00 (2006.01); G06T 19/20 (2011.01); B33Y 50/02 (2015.01); G06F 30/17 (2020.01);
U.S. Cl.
CPC ...
G06T 15/08 (2013.01); B33Y 50/02 (2014.12); G06F 30/17 (2020.01); G06T 17/00 (2013.01); G06T 19/20 (2013.01);
Abstract

In some embodiments, techniques are provided for analyzing the manufacturability or fabricability of objects based on segmented designs. In some embodiments, a scanning device scans a manufacturing device and/or an object manufactured by the manufacturing device to characterize a manufacturing capability of the manufacturing device. A paintbrush pattern may be determined based on the characterization, and a proposed design may be determined to be fabricable or non-fabricable using the paintbrush pattern.


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