The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Jun. 12, 2018
Hangzhou Hikvision Digital Technology Co., Ltd., Hangzhou, CN;
Yunlu Xu, Hangzhou, CN;
Gang Zheng, Hangzhou, CN;
Zhanzhan Cheng, Hangzhou, CN;
Yi Niu, Hangzhou, CN;
HANGZHOU HIKVISION DIGITAL TECHNOLOGY CO., LTD, Hangzhou, CN;
Abstract
An object recognition method and apparatus for a deformed image are provided. The method includes: inputting an image into a preset localization network to obtain a plurality of localization parameters for the image, wherein the preset localization network comprises a preset number of convolutional layers, and wherein the plurality of localization parameters are obtained by regressing image features in a feature map that is generated from a convolution operation on the image; performing a spatial transformation on the image based on the plurality of localization parameters to obtain a corrected image; and inputting the corrected image into a preset recognition network to obtain an object classification result for the image. In the process of the neural network based object recognition, the embodiment of the present application first transforms the deformed image that has deformation, and then performs the object recognition on the transformed image.