The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Aug. 01, 2018
Adacotech Incorporated, Tokyo, JP;
ADACOTECH INCORPORATED, Tokyo, JP;
Abstract
An abnormality detection device calculates high-dimensional feature values from real world data; projects, by using a matrix generated from real world data collected for learning so as to project the feature values onto an abnormality discriminant space, feature values calculated from real world data which is input for inspection onto an abnormality discriminant space, the abnormality discriminant space being used for determining presence or absence of an abnormality; judges the presence or absence of an abnormality from a distribution in the abnormality discriminant space; identifies, if an abnormality is found and if the abnormality is a known abnormality, the content of the abnormality from a trend of a distribution in the abnormality discriminant space and presenting the content of the abnormality; and visually displays a distribution in the abnormality discriminant space as a detection result of an abnormality.