The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Mar. 08, 2019
Seiko Epson Corporation, Tokyo, JP;
Masaki Hayashi, Matsumoto, JP;
Tomonori Mano, Shiojiri, JP;
Abstract
A control apparatus includes a processor that executes a first point cloud generation process including a first imaging process of acquiring a first image according to a first depth measuring method and a first analysis process of generating a first point cloud and a second point cloud generation process including a second imaging process of acquiring a second image according to a second depth measuring method and a second analysis process of generating a second point cloud, and detects the object using the first point cloud or the second point cloud. The first point cloud generation process completes in a shorter time than the second point cloud generation process, and the processor starts the second point cloud generation process after the first imaging process and discontinues the second point cloud generation process if the first point cloud satisfies a predetermined condition of success.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile