The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Mar. 01, 2020
Applicant:

Ubtech Robotics Corp Ltd, Shenzhen, CN;

Inventors:

Yusheng Zeng, Shenzhen, CN;

Jianxin Pang, Shenzhen, CN;

Youjun Xiong, Shenzhen, CN;

Assignee:

UBTECH ROBOTICS CORP LTD, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06K 9/00 (2006.01); G06T 7/136 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00255 (2013.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G06T 2207/20221 (2013.01);
Abstract

The present disclosure provides a face image quality evaluating method as well as an apparatus and a computer-readable storage medium using the same. The method includes: obtaining a face image; determining a local bright area in the face image, wherein the local bright area is formed by an illumination source in the face image, and the brightness of the local bright area is greater than the brightness of a face area in the face image; removing the local bright area from the face image; and evaluating a quality of the face image based on the face image having removed the local bright area. In the above-mentioned manner, the present disclosure improves the accuracy of the quality evaluation of the face image.


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