The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Oct. 29, 2018
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Shiri Gaber, Beer Sheva, IL;

Omer Sagi, Mazkeret Batya, IL;

Avitan Gefen, Tel Aviv, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2019.01); G06F 16/23 (2019.01); G06Q 20/10 (2012.01); G06F 16/22 (2019.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/2228 (2019.01); G06Q 20/10 (2013.01); G06N 5/047 (2013.01); G06N 20/00 (2019.01);
Abstract

Techniques are provided for identifying anomalies in an Internet of Things (IoT) activity profile of a user using an analytic engine. An exemplary method comprises obtaining data from a plurality of IoT devices of a user, wherein at least one IoT device comprises an agent device that performs an action on behalf of the user; applying the obtained data to a feature engineering module to convert the obtained data into time-series features that capture behavior and/or characteristics of an IoT environment of the user; and applying the time-series features to an analytic engine comprising a multi-variate anomaly detection method that learns one or more patterns in the IoT activity profile of the user for a normal state and identifies an anomaly with respect to an action performed by the agent device based on a health score indicating a deviation from the learned patterns.


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