The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Feb. 26, 2020
Applicant:
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Inventors:
Qingyun Liu, Beijing, CN;
Hongpo Gao, Beijing, CN;
Jianbin Kang, Beijing, CN;
Geng Han, Beijing, CN;
Ping Ge, Beijing, CN;
Assignee:
EMC IP Holding Company LLC, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/07 (2006.01); G06F 11/32 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1076 (2013.01); G06F 11/0772 (2013.01); G06F 11/0784 (2013.01); G06F 11/0787 (2013.01); G06F 11/3034 (2013.01); G06F 11/327 (2013.01);
Abstract
Techniques involve avoiding a potential failure event on a disk array. Along these lines, data collected for a disk array are obtained. It is determined, based on the collected data, whether a potential failure event is to occur on the disk array. In response to determining that the potential failure event is to occur on the disk array, an action to be taken for the disk array is determined, to avoid occurrence of the potential failure event.