The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Jan. 31, 2019
Applicants:

China National Petroleum Corporation, Beijing, CN;

Bgp Inc., China National Petroleum Corporation, Hebei, CN;

Inventors:

Qihu Jin, Beijing, CN;

Congwei Liu, Beijing, CN;

Yanpeng Li, Beijing, CN;

Fei Li, Beijing, CN;

Gang Xu, Beijing, CN;

Fangdong Chu, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); G01V 1/00 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/288 (2013.01); G01V 1/005 (2013.01); G01V 1/30 (2013.01); G01V 2210/123 (2013.01); G01V 2210/6222 (2013.01);
Abstract

The embodiments of the present application include acquiring a monitoring region and each observation point therein; partitioning the monitoring region into N layers of grids according to a seismic source positioning accuracy, wherein a side length of a grid cell of an i-th layer of grid is D/2, i=1, . . . N, and D is an initial side length of the grid cell and not more than a double of a distance between the respective observation points; searching all nodes in a first layer of grid to acquire a node satisfying a preset condition therefrom; from i=2, determining and searching nodes satisfying a first preset requirement in the i-th layer of grid, to acquire a node satisfying the preset condition therefrom, until a search in an N-th layer of grid is completed, wherein a node satisfying the preset condition acquired in the N-th layer of grid is a seismic source point location.


Find Patent Forward Citations

Loading…