The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Jun. 25, 2019
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Xinwei Shi, Mountain View, CA (US);

Brian A. Hargreaves, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/565 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/5611 (2013.01); G01R 33/56545 (2013.01);
Abstract

A method for magnetic resonance imaging reconstructs images that have reduced under-sampling artifacts from highly accelerated multi-spectral imaging acquisitions. The method includes performing by a magnetic resonance imaging (MRI) apparatus an accelerated multi-spectral imaging (MSI) acquisition within a field of view of the MRI apparatus, where the sampling trajectories of different spectral bins in the acquisition are different; and reconstructing bin images using neural network priors learned from training data as regularization to reduce under-sampling artifacts.


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