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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11125797 B1

PDFFull Text
Date of Patent:
Sep. 21, 2021

Filed:

Apr. 17, 2019

Signal generator and a measurement system including signal generator

Applicant:

Korea Research Institute of Standards and Science, Daejeon, KR;

Inventors:

No Weon Kang, Daejeon, KR;

Jeongil Park, Daejeon, KR;

Assignee:

Korea Research Institute of Standards and Science, Daejeon, KR;

Attorneys:

Central California IP Group, P.C.

Andrew D. Fortney

Primary Examiner:

Christopher P McAndrew

Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 27/32 (2006.01); G01R 31/28 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0892 (2013.01); G01R 27/32 (2013.01); G01R 29/08 (2013.01); G01R 29/0878 (2013.01); G01R 29/10 (2013.01); G01R 31/28 (2013.01);
Abstract

A measurement system according to an embodiment of the present invention comprises: an analyzer; a first expansion module for transmitting a first electromagnetic wave signal to a first antenna under control of the analyzer; a second expansion module for receiving a second electromagnetic wave signal through a second antenna; a first signal generator for generating a first local oscillation signal under control of the analyzer, and detecting a reference characteristic of the first electromagnetic wave signal and a first test characteristic of the first antenna by using the first local oscillation signal; and a second signal generator for generating a second local oscillation signal under control of the analyzer, and detecting a second test characteristic of the second antenna by using the second local oscillation signal, wherein the first signal generator comprises a controller for converting instructions transmitted from the analyzer into internal instructions, and a local oscillation signal generator for generating the first local oscillation signal according to the internal instructions.

Find Patent Forward Citations

Kang, No. (2021). Signal generator and a measurement system including signal generator (U.S. Patent No. 11125797). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11125797

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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