The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Mar. 23, 2018
Trutag Technologies, Inc., Kapolei, HI (US);
Hod Finkelstein, Berkeley, CA (US);
Timothy Learmonth, Berkeley, CA (US);
TruTag Technologies, Inc., Kapolei, HI (US);
Abstract
A system detects an analyte suspected of being present in a sample. The reader reads an optical tag on a substrate, which is configured to immobilize the tag on a substrate surface. The optical tag is bound to a probe and includes a plurality of pores that create an effective index of refraction. The plurality of pores and a thickness of the tag are selected for a reflectance property. The substrate is configured to contact a sample suspected of comprising an analyte. The probe is capable of binding specifically to the analyte. The reader is configured to expose the tag to light to generate a sample spectral signature that is a function of the effective index of refraction, the thickness of the optical tag, and whether the analyte is coupled to the probe. The sample spectral signature is compared to a reference to detect the analyte in the sample.