The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Mar. 05, 2020
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Shinsuke Hayashida, Tokyo, JP;

Takashi Takasaki, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/046 (2018.01); G06T 3/20 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 3/20 (2013.01); G06T 11/005 (2013.01); G01N 2223/303 (2013.01); G01N 2223/401 (2013.01); G01N 2223/425 (2013.01);
Abstract

An image processing apparatus that processes an image obtained from an imaging sensor having a plurality of pixels arranged in a matrix pattern, the pixels including a first pixel group for obtaining a pixel value corresponding to a radiation dose and a second pixel group for obtaining an offset value even with irradiation with radiation, performs offset correction of a radiation image obtained from the plurality of pixels by an imaging operation with irradiation with radiation based on a dark image obtained from the plurality of pixels by an imaging operation without irradiation with radiation, calculates a statistic value of pixel values obtained from the second pixel group of the corrected radiation image, and corrects pixel values obtained from the first pixel group, which have been offset-corrected, based on a temporal variation in the statistic value.


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