The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Oct. 11, 2018
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Fangzhou Cheng, Mountain View, CA (US);
Ajay Raghavan, Mountain View, CA (US);
Deokwoo Jung, Mountain View, CA (US);
PALO ALTO RESEARCH CENTER INCORPORATED, Palo Alto, CA (US);
Abstract
One embodiment can provide a system for detecting faults in a machine. During operation, the system can obtain a dynamic signal associated with the machine, apply one or more signal-processing techniques to the dynamic signal to obtain frequency, amplitude, and/or time-frequency information associated with the dynamic signal, extract motion-insensitive features from the obtained frequency, amplitude, and/or time-frequency information associated with the dynamic signal, and determine whether a fault occurs in the machine based on the extracted features.