The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Sep. 10, 2018
Applicant:
Renesas Electronics Corporation, Tokyo, JP;
Inventors:
Kan Takeuchi, Tokyo, JP;
Shinya Konishi, Tokyo, JP;
Fumio Tsuchiya, Tokyo, JP;
Masaki Shimada, Tokyo, JP;
Assignee:
RENESAS ELECTRONICS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/01 (2006.01); G01R 31/30 (2006.01); G01K 15/00 (2006.01);
U.S. Cl.
CPC ...
G01K 7/01 (2013.01); G01R 31/3004 (2013.01); G01K 15/005 (2013.01);
Abstract
An object of the present invention is to provide a technique of duplexing monitor circuits in which a common cause failure can be eliminated. A semiconductor device has: a first monitor circuit monitoring that temperature or voltage of the semiconductor device is within a normal operation range; and a second monitor circuit monitoring normal operation of the first monitor circuit. The first and second monitor circuits generate information of temperature or voltage on the basis of different principles.