The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Jun. 26, 2020
Applicant:

Dr. Johannes Heidenhain Gmbh, Traunreut, DE;

Inventors:

Thomas Becker, Traunreut, DE;

Josef Mitterleitner, Chieming, DE;

Wolfgang Pucher, Traunstein/Rettenbach, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01D 5/244 (2006.01); G01D 5/347 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 21/04 (2013.01); G01D 5/24438 (2013.01); G01D 5/34746 (2013.01); G01D 2205/95 (2021.05);
Abstract

A position-measuring device includes a carrier body and scanning units movable relative thereto. At least three surfaces of the carrier body each carry a first and second measuring graduation, each having a series of graduation lines. Each of the measuring graduations is associated with a scanning unit for scanning the respective measuring graduation at a scanning location such that, for each surface, two scanning units are disposed for scanning the respective measuring graduations. In each case, these two scanning units are disposed in such a way, and the graduation lines of the two measuring graduations are inclined with respect to each other in such a way, that two normal planes extending respectively in the direction of the respective graduation lines through the respective scanning locations of the two scanning units have a common axis of intersection, whereby the three resulting axes of intersection extend through a common point.


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