The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11125071 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 21, 2021

Filed:

Oct. 23, 2020
Applicant:

Southwest Petroleum University, Chengdu, CN;

Inventors:

Hu Yin, Chengdu, CN;

WenFeng Yin, Chengdu, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 44/00 (2006.01); E21B 49/00 (2006.01); E21B 43/34 (2006.01);
U.S. Cl.
CPC ...
E21B 44/00 (2013.01); E21B 43/34 (2013.01); E21B 49/005 (2013.01);
Abstract

The invention introduces a downhole failure analysis and processing method and device based on the partical diameter distribution of drilling cuttings. The device includes body frame, screening component, feeding system, weighing mechanism, driving mechanism and control system, which can realize automatic grading and screening according to the partical diameter of cuttings and weigh the cuttings at all levels; the method adopts the debris sieving device to measure the particle diameter distribution of cuttings, establishes a standard partical diameter distribution database of cuttings, compares with the real-time partical diameter distribution of cuttings to detect the downhole failure, and then selects the corresponding failure solution from the downhole failure data to remove the downhole failure. The invention can sieve cuttings according to the partical diameter grading, obtain the partical diameter distribution of cuttings, quickly identify the downhole failure according to the partical diameter distribution of cuttings, and remove the downhole failure.


Find Patent Forward Citations

Yin, Hu. (2021). Downhole failure analysis and processing method based on the particle diameter distribution of cuttings (U.S. Patent No. 11125071). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11125071

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