The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Dec. 20, 2019
Applicant:

Arevo, Inc., Milpitas, CA (US);

Inventors:

Hemant Bheda, Saratoga, CA (US);

Wiener Mondesir, Oakland, CA (US);

Riley Reese, Sunnyvale, CA (US);

Shekar Mantha, Brighton, MA (US);

Assignee:

Arevo, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 99/00 (2006.01); B29C 64/386 (2017.01); B33Y 50/02 (2015.01); G05B 19/4099 (2006.01);
U.S. Cl.
CPC ...
B29C 64/386 (2017.08); B33Y 50/02 (2014.12); G05B 19/4099 (2013.01); G05B 2219/35134 (2013.01); G05B 2219/49011 (2013.01); Y02P 90/02 (2015.11);
Abstract

The present invention relates to a system and a method for optimizing printing parameters, such as slicing parameters and tool path instructions, for additive manufacturing. The present invention comprises a property analysis module that predicts and analyses properties of a filament object model, representing a constructed 3D object. The filament object model is generated based on the tool path instructions and user specified object properties. Analysis includes comparing the predicted filament object model properties with the user specified property requirements; and further modifying the printing parameters in order to meet the user specified property requirements.


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