The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Oct. 25, 2019
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Dirk Schaefer, Hamburg, DE;

Axel Thran, Hamburg, DE;

Thomas Koehler, Norderstedt, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01T 1/20 (2006.01); G01T 1/29 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 5/0075 (2013.01); A61B 6/42 (2013.01); G01T 1/2008 (2013.01); G01T 1/2985 (2013.01);
Abstract

An imaging system includes radiation source that emits radiation that traverses an examination region and a portion of a subject therein and a detector array that detects radiation that traverses the examination region and the portion of the subject therein and generates a signal indicative thereof. A volume scan parameter recommender recommends at least one spectral scan parameter value for a volume scan of the portion of the subject based on a spectral decomposition of first and second 2D projections acquired by the radiation source and detector array. The first and second 2D projections have different spectral characteristics. A console employs the recommended at least one spectral scan parameter value to perform the volume scan of the portion of the subject.


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