The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Aug. 06, 2015
Hitachi, Ltd., Tokyo, JP;
Yo Taniguchi, Tokyo, JP;
Suguru Yokosawa, Tokyo, JP;
Hisaaki Ochi, Tokyo, JP;
Toru Shirai, Tokyo, JP;
Shinji Kurokawa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A technology of improving image quality of a calculation image or parameter estimation accuracy even in a case where a method of simultaneously generating calculation images of a plurality of parameters is used is provided. Thus, by utilization of a reconstructed image in an optimal resolution of each parameter to be estimated, a value of the parameter is estimated and a calculation image that is a distribution of the value of the parameter is acquired. A reconstructed image in an optimal resolution is acquired by adjustment of a resolution of a reconstructed image acquired in an optimal resolution of an estimation parameter with the highest optimal resolution among parameters to be estimated in scanning. Alternatively, in scanning, only a reconstructed image used for calculation of a predetermined parameter to be estimated is acquired in an optimal resolution of the parameter to be estimated.