The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Jul. 23, 2018
Applicant:
Olympus Corporation, Tokyo, JP;
Inventors:
Takayasu Ito, Hino, JP;
Eiji Matsuda, Sagamihara, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/005 (2006.01); G02B 23/24 (2006.01); A61B 1/00 (2006.01); A61B 1/01 (2006.01); A61B 1/05 (2006.01); A61B 1/07 (2006.01);
U.S. Cl.
CPC ...
A61B 1/0052 (2013.01); A61B 1/00066 (2013.01); A61B 1/00137 (2013.01); A61B 1/00142 (2013.01); A61B 1/01 (2013.01); G02B 23/24 (2013.01); G02B 23/2476 (2013.01); A61B 1/05 (2013.01); A61B 1/07 (2013.01);
Abstract
An endoscope according to one aspect of the present invention includes: an operation lever portion that is provided in an operation portion, includes an operation shaft, and is capable of adjusting a bending angle of a bending portion in conjunction with a tilting operation; and an exterior cover that is water-tightly fixed to the operation portion so as to cover an outer periphery of the operation shaft, and is formed in a stair shape in cross section, including a hardly deformed region and an easily deformed region that is formed at a predetermined angle with respect to the hardly deformed region.