The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Feb. 23, 2020
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventor:

Martin Bragg, Bracknell, GB;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04L 29/08 (2006.01); G05B 19/042 (2006.01); G05B 19/048 (2006.01); H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
H04Q 9/00 (2013.01); G05B 19/0423 (2013.01); H04L 29/06068 (2013.01); H04L 63/02 (2013.01); G05B 2219/31369 (2013.01); H04Q 2209/70 (2013.01);
Abstract

A universal metering cabinet (UMC) apparatus comprises an input/output (I/O) interface configured to receive at least two data streams, each of the at least two data streams received from one of at least two sensors, and each of the at least two data streams having a different connectivity protocol. The UMC further comprises a customizable programmable interface coupled with the I/O interface and configured to convert the connectivity protocol of each of the at least two data streams into a same uniform connectivity protocol. A method comprises receiving, from the UMC, at least one data stream that includes data from at least two sensors, and receiving, from at least one server, data related to an environment around the at least two sensors. The method further comprises performing data cleansing on the data stream and the data to generate validated data and performing prognostic modeling on the validated data.


Find Patent Forward Citations

Loading…