The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
Aug. 20, 2020
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Takayuki Shiota, Kitakyushu, JP;
Ryoichi Hirayama, Kitakyushu, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01); H04N 1/00 (2006.01); H04N 1/32 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00037 (2013.01); H04N 1/00018 (2013.01); H04N 1/0071 (2013.01); H04N 1/00639 (2013.01); H04N 1/00748 (2013.01); H04N 1/3263 (2013.01);
Abstract
A control unit of an image reading apparatus acquires, at an upstream position in a medium transportation direction of an abnormality determination area set for a leading-edge area of a medium, a distance WL from a center position in a medium width direction intersecting with the medium transportation direction to one edge in the medium width direction and a distance WR from the center position to the other edge in the medium width direction, and compares a value R that is a ratio between the distance WL and the distance WR or a difference therebetween with a threshold Rdetermined in advance.