The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Jan. 25, 2019
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Weipeng Jiang, Beijing, CN;

Yongjun Liu, Beijing, CN;

Yun Lei, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04W 24/10 (2009.01); H04L 29/06 (2006.01); H04B 7/06 (2006.01); H04W 8/00 (2009.01); H04W 24/08 (2009.01); H04W 72/04 (2009.01);
U.S. Cl.
CPC ...
H04L 1/0026 (2013.01); H04B 7/0626 (2013.01); H04L 29/06 (2013.01); H04W 8/005 (2013.01); H04W 24/08 (2013.01); H04W 24/10 (2013.01); H04W 72/0453 (2013.01);
Abstract

A method includes determining at least one first measurement AP in first storage APs according to the address of the first AP, sending a second CSI measurement request to the at least one first measurement AP, where the second CSI measurement request includes the address of the terminal, receiving first measurement data, where the first measurement data includes first CSI, the first CSI is obtained after a target measurement AP performs channel estimation on the first service data, and sending the first measurement data or a first processing result to the terminal, where the first processing result is obtained by using the first measurement data.


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