The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Jul. 30, 2020
Applicant:

Seagate Technology Llc, Fremont, CA (US);

Inventors:

Deepak Sridhara, Longmont, CO (US);

Jason Bellorado, San Jose, CA (US);

Ara Patapoutian, Hopkinton, MA (US);

Marcus Marrow, San Jose, CA (US);

Assignee:

SEAGATE TECHNOLOGY LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G11B 20/18 (2006.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/6343 (2013.01); G11B 20/1833 (2013.01); H03M 13/1111 (2013.01); H03M 13/6331 (2013.01);
Abstract

An error recovery process provides for identifying a set of failed data blocks read from a storage medium during execution of a read command, populating sample buffers in a read channel with data of a first subset of the set of failed data blocks, and initiating an error recovery process on the data in the sample buffers. Responsive to successful recovery of one or more data blocks in the first subset, recovered data is released from the sample buffers and sample buffers locations previously-storing the recovered data are repopulated with data of a second subset of the set of failed data blocks. The error recovery process is then initiated on the data of the second subset of the failed data blocks while the error recovery process is ongoing with respect to data of the first subset of failed data blocks remaining in the sample buffers.


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