The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Sep. 21, 2020
Applicants:

SK Hynix Inc., Icheon, KR;

Seoul National University R&db Foundation, Seoul, KR;

Inventors:

Soyeong Shin, Uiwang, KR;

Han-Gon Ko, Seoul, KR;

Deog-Kyoon Jeong, Seoul, KR;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/081 (2006.01); H03K 5/131 (2014.01); G06F 1/10 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H03L 7/0814 (2013.01); G06F 1/10 (2013.01); H03K 5/131 (2013.01); H03K 2005/00065 (2013.01);
Abstract

A semiconductor device includes a signal delay circuit configured to output a plurality of multi-phase output signals by delaying a plurality of multi-phase input signals according to a plurality of delay codes, respectively; and a calibration circuit including an error detection circuit configured to provide phase difference information between signals selected among the plurality of the multi-phase output signals according to a variable delay code and a filter configured to provide the plurality of delay codes and the variable delay code, wherein the filter performs update operation to update the plurality of delay codes or the variable delay code.


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