The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Oct. 18, 2019
Applicant:

Midea Group Co., Ltd., Foshan, CN;

Inventors:

Thanh Huy Ha, Milpitas, CA (US);

Yuxiang Gao, San Jose, CA (US);

Zhicai Ou, San Jose, CA (US);

Assignee:

MIDEA GROUP CO., LTD., Foshan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G05B 13/04 (2006.01); G06N 20/00 (2019.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06K 9/628 (2013.01); G05B 13/048 (2013.01); G06K 9/6256 (2013.01); G06N 5/046 (2013.01); G06N 20/00 (2019.01);
Abstract

System and method for controlling a machine, including: receiving a first image processing model trained to classify an input image into a first class for images containing at least one object of a first type or a second class for images not containing an object of the first type; identifying a subset of inference results that are false positive results; generating a set of new training data from the first set of images, including augmenting an image in the first set of images to obtain a respective plurality of images and labeling the respective plurality of images as containing at least one object of a pseudo first class; training a second image processing model to classify an input image into the first class, the second class, and the first pseudo class; and modifying a device setting of a machine based on an inference result of the second image processing model.


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