The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
Sep. 10, 2019
Denso Ten Limited, Kobe, JP;
Nobuhisa Ikeda, Kobe, JP;
Nobunori Asayama, Kobe, JP;
Takashi Kono, Kobe, JP;
Yasushi Tani, Kobe, JP;
Daisuke Yamamoto, Kobe, JP;
Tomokazu Oki, Kobe, JP;
Teruhiko Kamibayashi, Kobe, JP;
DENSO TEN Limited, Kobe, JP;
Abstract
An extraneous-matter detecting apparatus includes a region setting unit, a computing unit, a change-value setting unit, an updating unit, and a detection unit. The region setting unit sets divided regions for a captured image captured by an image capturing device. The computing unit computes, for a corresponding divided region, a first difference between a past representative value of luminance and a present representative value of luminance and a second difference between a past dispersion amount of luminance and a present dispersion amount of luminance. The change-value setting unit sets, based on the first and the second differences, a change value of a counter value that indicates an adhesion state of an extraneous matter in the divided region. The updating unit updates the counter value based on the change value. The detection unit detects, based on the counter value, an adhesion state of an extraneous matter in the divided region.