The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Apr. 15, 2019
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Andrew J. Lewis, Litchfield, NH (US);

Kenny C. Gross, Escondido, CA (US);

Michael H. S. Dayringer, Union City, CA (US);

Guang C. Wang, San Diego, CA (US);

Assignee:

Oracle International Corporation, Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/56 (2013.01); G06F 17/14 (2006.01); G01R 31/28 (2006.01); G06F 21/71 (2013.01);
U.S. Cl.
CPC ...
G06F 21/567 (2013.01); G01R 31/2813 (2013.01); G06F 17/142 (2013.01); G06F 21/71 (2013.01);
Abstract

The disclosed embodiments provide a system that detects unwanted electronic components in a target computing system. During operation, the system obtains target electromagnetic interference (EMI) signals, which were gathered by monitoring EMI signals generated by the target computing system, using an insertable device, wherein when the insertable device is inserted into the target computing system, the insertable device gathers the target EMI signals from the target computing system. Next, the system generates a target EMI fingerprint from the target EMI signals. Finally, the system compares the target EMI fingerprint against a reference EMI fingerprint for the target computing system to determine whether the target computing system contains any unwanted electronic components.


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