The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2021

Filed:

Aug. 28, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Saurabh Chadha, Bangalore, IN;

Daniel Lewis, Bangalore, IN;

Diyanesh B. Chinnakkonda Vidyapoornachary, Bangalore, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 11/273 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01); G06F 11/0721 (2013.01); G06F 11/0751 (2013.01); G06F 11/273 (2013.01); G06F 11/348 (2013.01);
Abstract

A computer-implemented method for instruction-level tracing for analyzing processor failure includes detecting a failure during operation of a processor circuit. The method further includes parsing a miscompare trace to determine a plurality of opcodes executed by the processor prior to the failure. The method further includes generating a workload comprising a set of opcodes by filtering the set of opcodes from the miscompare trace. The method further includes performing a consistency check of the workload to determine a commit ratio of the workload, the commit ratio indicative of a number of times the failure occurs when the workload is executed a predetermined number of times. The method further includes using the workload for debugging the failure based on the commit ratio being above a predetermined threshold.


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