The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
May. 13, 2020
Industrial Technology Research Institute, Hsinchu, TW;
Cheng-Wei Wang, Taipei, TW;
Kuo-Hua Chou, Zhubei, TW;
Chien-Chih Liao, Taichung, TW;
Jen-Ji Wang, Taichung, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
A method for inspecting defects of a machining path is provided. The method includes the following steps. Firstly, a contour mold with a plurality of surface nodes is generated according to a machining program code. Next, a normal vector of each surface node of the contour mold is calculated. Then, a tangent vector of a block of the machining program code corresponding to the normal vector is calculated. Afterwards, an error information is obtained according to a relation between the normal vector and the tangent vector. When the error information is greater than a predetermined value, a defect information is shown on the contour mold.