The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2021
Filed:
Oct. 10, 2019
Baden-württemberg Stiftung Ggmbh, Stuttgart, DE;
Ding Luo, Karlsruhe, DE;
BADEN-WÜRTTEMBERG STIFTUNG GMBH, Stuttgart, DE;
Abstract
An area scanning confocal microscope includes a pattern generation unit configured to generate or produce a line pattern comprising a plurality of lines, for example a plurality of straight parallel lines; a projection unit comprising a microscope objective configured to project the line pattern onto an object through the microscope objective, wherein the focal plane in which the line pattern is projected or imaged is tilted at a tilting angle with respect to an optical axis of the microscope, the tilting angle being equal to or greater than 0° and smaller than 90°, for example between 30° and smaller than 85°; and an imaging unit comprising a two-dimensional image detector configured to capture within one image frame of the image detector an image of the projected line pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile